Analytical instruments, like mass spectrometers or scanning electron microscopes are used in many different industries, research and science. These precision instruments are very advanced and technically complex. Vacuum pressure is essential for many types of analytical instruments to enable functionality, enhance sensitivity and prevent contamination from atmospheric air. The high level of complexity and precision engineering also sets high performance and quality standards for the vacuum system and vacuum measurement instrumentation.

Sens4 offers vacuum measurement products and solutions for integration in analytic instruments including:

• Atomic Force Microscopy (AFM)
• Energy Dispersive X-ray Spectroscopy (EDX, EDS)
• Fourier Transform Infrared Spectroscopy (FTIR)
• Gas Chromatography 
• Mass Spectrometry (LCMS, GCMS, ICPMS, TOF)
• Materials Porosity
• Particle Surface Area (BET) 
• Vapor Pressure Measurement
• Scanning Electron Microscopy (SEM)
• Spark & Arc Emission Spectrometer (AES)
• Thermo-gravimetric analysis (TGA)
• Ultraviolet absorption spectroscopy